半導體
2D檢量測系統
興城提供不同精度的2D檢量測方案，提供半導體與封裝製程中，任何需要進行2D檢測的缺陷。
系統特性
- 超高解析度與高產能檢測。
- 量測精度：≥ ±1 微米（µm）。
- 即時檢測，防止良率損失。
- 數據精準量化，降低誤判。
- AI 智能判別選配，強化自動化檢測。
- 客製化設備結構配置規劃。
適用場域
- 任何物件外觀缺陷檢量測。
2D AOI measuring System
We offer a wide range of 2D inspection solutions for semiconductors and OSATs processes, targeting any defect requiring 2D inspection.
System Features:
- Ultra-high-resolution and high-throughput inspection
- Dimensional accuracy: ≥ ±1 μm
- Real-time inspection to prevent yield loss
- Quantitative data analysis to reduce false positives
- Use AI to assist defect classification to enhance auto-Inspection
- Customizable configuration and equipment layout
Applications:
- General 2D surface defect inspection of any component