IC Substrate
斷短路測試檢查機
開發專有 ASIC 晶片，採用自主開發電測 ASIC 晶片，實現各種類型基板的快速斷短路測試檢查，並可實現漏電測試能力達 500 mΩ 以上（輸入電壓 250V）、阻抗測試精度達 5 mΩ ±5% 等要求。
Develop proprietarily ASIC chip
Development of proprietary ASIC chips featuring in-house designed electrical test ASICs, enabling rapid open/short circuit inspection for various substrate types.
Supports leakage current testing capabilities exceeding 500 mΩ (at 250V input voltage) and impedance measurement accuracy of 5 mΩ ±5%, meeting stringent quality requirements.