IC Substrate
內埋量測
依隨AI產品需求，IC載板藉由內埋元件，提升對應大功率、高溫等需求。斷短路測試檢查機內建 LCR 測量模組，實現開短路檢測與內埋電性測試一體化功能，大幅提升整體檢測效率與系統可靠度。
Built-in Capacitor Test
Driven by AI product demands, IC substrates integrate embedded components to meet high-power and high-temperature requirements.
The open/short circuit inspection system features a built-in LCR measurement module, enabling integrated open/short testing and embedded electrical performance verification.
This significantly enhances overall inspection efficiency and system reliability.